Onto Innovation supplies process-control, inspection and metrology systems used in semiconductor and advanced packaging manufacturing. Its tools measure film thickness, critical dimensions, defects and overlay so chipmakers can tighten yields on complex nodes. Formed from the combination of Nanometrics and Rudolph Technologies, the company focuses on high-precision optical and software analytics rather than wafer fabrication equipment itself.
| Quarter | Revenue | YoY % | Earnings | YoY % |
|---|---|---|---|---|
| Q1 2025 | 266.6 | — | 64.1 | — |
| Q2 2025 | 253.6 | — | 33.9 | — |
| Q3 2025 | 218.2 | — | 28.2 | — |
| Q4 2025 | 266.9 | — | 10.5 | — |
| Q1 2026 | 291.9 | 9.5% | 33.8 | -47.3% |
| Q2 2026 | 343.1 | 35.3% | 60.1 | 77.2% |
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